Process Automation with Vision
Advanced Vision Systems for Challenging Applications
Semiconductor Wafer Macro Inspection
- Detection involved propriatory fast image registration and comparison with the master image
- Reduce inspection time from seconds to milliseconds
Copper Piper Oxidation Detection
- Detection involved identify cooper oxides in presence of multiple dents and discolorations
- Customer increased production yield after rolling by 3%
On-line Formation System
- New Formation Index that combines image intensity distribution with floc spatial distribution
- 95+% correlation with customer’s off-line formation measurements
- Tested for grades up to 560 g/m2
- Special processing for specialty grades
- Available as on-line and off-line system